THIN-FILM INFRARED SPECTROSCOPIC METHOD FOR LOW-TEMPERATURE VAPOR-PRESSURE MEASUREMENTS

被引：29

作者：

KHANNA, RK

ALLEN, JE

MASTERSON, CM

ZHAO, G

机构：

[1] Department of Chemistry and Biochemistry, University of Maryland, College Park

[2] Code 691, NASA Goddard Space Flight Center, Greenbelt

来源：

JOURNAL OF PHYSICAL CHEMISTRY | 1990年 / 94卷 / 01期

关键词：

D O I：

10.1021/j100364a075

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new thin-film infrared (TFIR) technique is presented for measuring the vapor pressures of organics at low temperatures. It is based on the measurement of the loss rate of the sample at a particular temperature. This loss rate is measured by monitoring a characteristic infrared absorption feature for the compound. The method was calibrated by using solid CO2 for which previous low-temperature vapor pressure data are available in the literature. The vapor pressures of solid C4H2 and C4N2 were also determined. Results differ from extrapolated values of high-temperature measurements by as much as a factor of 25. © 1990 American Chemical Society.

引用

页码：440 / 442

页数：3

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