ION TRAP AS A FREQUENCY STANDARD MEASUREMENT OF BA+ HFS FREQUENCY FLUCTUATIONS

被引:21
作者
KNAB, H
NIEBLING, KD
WERTH, G
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D O I
10.1109/TIM.1985.4315314
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:242 / 245
页数:4
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