FABRICATION AND CHARACTERIZATION OF RAMP EDGE-TYPE JUNCTION AND SQUIDS

被引：7

作者：

ALVAREZ, GA

KURODA, M

MATSUDA, M

MIYAMOTO, K

KASAI, N

KOYANAGI, M

NEMOTO, T

机构：

[1] MEIJI UNIV,KANAGAWA,JAPAN

[2] MURORAN INST TECHNOL,MURORAN,HOKKAIDO,JAPAN

[3] CHIBA INST TECHNOL,CHIBA,JAPAN

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1995年 / 5卷 / 02期

关键词：

D O I：

10.1109/77.403161

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have investigated the properties of high-T-c ramp-edge geometry Josephson weak links using superconducting YBa2Cu3O7-8 (YBCO) electrodes and PrBa2Cu3O7-delta (PBCO) normal-metal layers. Unambiguous evidence of Josephson behaviour has been observed. Current-Voltage Characteristics (CVC) were qualitatively consistent with the resistively-shunted-junction (RSJ) model. Well developed Shapiro steps for 8.9Ghz. microwave irradiation have been observed. Furthermore we have fabricated dc-SQUIDs with PBCO barriers that modulate up to a temperature of 80.6K. At 4.2K we find a flux-voltage modulation depth of approximate to 36 mu V.

引用

页码：2755 / 2758

页数：4

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[2]

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