FABRICATION OF NANOSTRUCTURES WITH MULTILEVEL ARCHITECTURE

被引:25
作者
TAYLOR, RP [1 ]
ADAMS, JA [1 ]
DAVIES, M [1 ]
MARSHALL, PA [1 ]
BARBER, R [1 ]
机构
[1] NATL RES COUNCIL CANADA,INST MICROSTRUCT SCI,OTTAWA K1A 0R6,ONTARIO,CANADA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1993年 / 11卷 / 03期
关键词
D O I
10.1116/1.586811
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The fabrication of a submicron-sized dot, defined by surface gates on a GaAs/AlGaAs heterostructure, is described. Within the dot, a voltage applied to a 200 nm diam central electrode changes the geometry to that of a ring. Contact to the central electrode was achieved using a layer of silicon nitride as an interlevel insulator. This multilayer architecture is presented as a demonstration of an interconnect technique, featuring alignment to within 10 nm, which may be used to link similar discrete nanostructures to form a circuit.
引用
收藏
页码:628 / 633
页数:6
相关论文
共 17 条
[1]  
BEAUMONT SP, 1981, P MICROCIRCUIT ENG A, P381
[2]  
COLERIDGE PT, UNPUB
[3]   THE FREQUENCY-LOCKED TURNSTILE DEVICE FOR SINGLE ELECTRONS [J].
GEERLIGS, LJ .
SURFACE SCIENCE, 1992, 263 (1-3) :396-404
[4]   ONE-DIMENSIONAL SUBBANDS AND MOBILITY MODULATION IN GAAS ALGAAS QUANTUM WIRES [J].
ISMAIL, K ;
ANTONIADIS, DA ;
SMITH, HI .
APPLIED PHYSICS LETTERS, 1989, 54 (12) :1130-1132
[5]  
ISMAIL K, 1992, TECHNOLOGY, V97, P299
[6]  
JALABERT RA, 1990, PHYS REV LETT, V65, P2443
[7]   QUANTIZED CURRENT IN A QUANTUM DOT TURNSTILE [J].
KOUWENHOVEN, LP ;
JOHNSON, AT ;
VANDERVAART, NC ;
MAAS, DJ ;
HARMANS, CJPM ;
FOXON, CT .
SURFACE SCIENCE, 1992, 263 (1-3) :405-408
[8]   GROWTH AND CHARACTERIZATION OF SILICON-NITRIDE FILMS PRODUCED BY REMOTE MICROWAVE PLASMA CHEMICAL VAPOR-DEPOSITION [J].
LANDHEER, D ;
SKINNER, NG ;
JACKMAN, TE ;
THOMPSON, DA ;
SIMMONS, JG ;
STEVANOVIC, DV ;
KHATAMIAN, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (05) :2594-2601
[9]  
LANDHEER D, IN PRESS
[10]   DRY ETCH PROCESSING OF GAAS/-ALGAAS HIGH ELECTRON-MOBILITY TRANSISTOR STRUCTURES [J].
PEARTON, SJ ;
REN, F ;
LOTHIAN, JR ;
FULLOWAN, TR ;
KOPF, RF ;
CHAKRABARTI, UK ;
HUI, SP ;
EMERSON, AB ;
KOSTELAK, RL ;
PEI, SS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (05) :2487-2496