QUESTION OF MICROCRYSTALLITES IN SOME AMORPHOUS MATERIALS - ELECTRON-MICROSCOPE INVESTIGATION

被引：53

作者：

HERD, SR ^{[1
]}

CHAUDHARI, P ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HEIGHTS,NY 10598

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1974年 / 26卷 / 02期

关键词：

D O I：

10.1002/pssa.2210260228

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：627 / 642

页数：16

共 17 条

[1] INTERPRETING ELECTRON MICROGRAPHS OF AMORPHOUS SOLIDS
BERRY, MV
DOYLE, PA
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1973, 6 (01): : L6 - L9
[2] CHAUDHAR.P, 1974, B AM PHYS SOC, V19, P317
[3] ELECTRON-MICROSCOPE INVESTIGATION OF STRUCTURE OF SOME AMORPHOUS MATERIALS
CHAUDHARI, P
HERD, SR
GRACZYK, JF
[J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972, 51 (02): : 801 - +
[4] COHERENT SCATTERING IN A RANDOM-NETWORK MODEL FOR AMORPHOUS SOLIDS
CHAUDHARI, P
CHARBNAU, HP
GRACZYK, JF
[J]. PHYSICAL REVIEW LETTERS, 1972, 29 (07) : 425 - +
[5] CHAUDHARI P, 1973, 5 P INT C AM LIQ SEM
[6] CHAUDHARI P, 1973, B AM PHYS SOC, V18, P420
[7] THEORY OF ELECTRON MICROGRAPHS OF AMORPHOUS MATERIALS
COCHRAN, W
[J]. PHYSICAL REVIEW B, 1973, 8 (02): : 623 - 629
[8] COCHRAN W, 1974, P INT C TETRAH BONDE
[9] IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST
EISENHANDLER, CB
SIEGEL, BM
[J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) : 1613 - +
[10] GRACZYK JF, TO BE PUBLISHED