INTERFACE AND GROWTH-MODE CHARACTERIZATION OF CE/FE AND CEH-APPROXIMATE-TO-2/FE MULTILAYERS BY X-RAY-DIFFRACTION AND RUTHERFORD BACKSCATTERING SPECTROSCOPY

The detailed structural characterization of ion beam sputtered Ce/Fe and CeH(almost-equal-to 2)/Fe multilayers offers the possibility for a better understanding of their magnetic properties. In the case of the Ce/Fe multilayers the extension of the interface, as one of the most important features, is determined to 5-7 angstrom by means of Monte Carlo simulations of the small-angle x-ray scattering diagrams. Below a critical thickness of almost-equal-to 24 angstrom Fe grows in an amorphous structure. Here the interface extension is enhanced. In contrast all CeH(almost-equal-to 2)/Fe multilayers show nearly abrupt interfaces. X-ray scattering experiments at higher angles in reflection and transmission mode provide information about the crystal structure, the texture, and the lateral dimensions of the grains in the samples. Depths profiles of the multilayers are generated by Rutherford backscattering spectroscopy, which confirm the well-ordered periodic structures. Surprisingly indications of an island-like growth mode of the Fe layers onto the Ce and CeH(almost-equal-to 2) layers could be resolved by using this procedure.