NEW INTERFEROMETRIC METHOD FOR DETERMINING REFRACTIVE-INDEX OF THIN DIELECTRIC FILM, ITS THICKNESS, PHASE-SHIFT, AND ORDER OF INTERFERENCE

被引：3

作者：

BARAKAT, N

ELSHAZLY, AFA

ELSHAIR, HT

机构：

[1] AIN SHAMS UNIV,FAC SCI,CAIRO,EGYPT

[2] AIN SHAMS UNIV,FAC EDUC,CAIRO,EGYPT

来源：

APPLIED PHYSICS | 1977年 / 14卷 / 03期

关键词：

D O I：

10.1007/BF00882738

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：319 / 323

页数：5

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