LEAD LOSS, PREFERRED ORIENTATION, AND THE DIELECTRIC-PROPERTIES OF SOL-GEL PREPARED LEAD TITANATE THIN-FILMS

The PbO loss during rapid thermal annealing of PbTiO3 thin films prepared by the sol-gel method has been investigated using electron probe microanalysis. The results have been correlated with the x-ray diffraction analyses and the dielectric properties of the films. The films start to loose PbO significantly during annealing at 600°C for 60 s. After annealing at 700°C the Pb/Ti ratios decrease down to 1.0 independent of the amount of excess PbO of the solutions. No PbO crystalline phases are observed in the x-ray diffraction patterns, therefore the excess PbO is assumed to remain in the films as an amorphous phase. © 1994 American Institute of Physics.