A TIME-RESOLVED OPTICAL-SYSTEM FOR SPATIAL CHARACTERIZATION OF THE CARRIER DISTRIBUTION IN A GATE TURN-OFF THYRISTOR (GTO)

被引：20

作者：

BLEICHNER, H ^{[1
]}

NORDLANDER, E ^{[1
]}

ROSLING, M ^{[1
]}

BERG, S ^{[1
]}

机构：

[1] GAVLE SANDVIKEN UNIV COLL,ELECTR,GAVLE,SWEDEN

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1990年 / 39卷 / 03期

关键词：

D O I：

10.1109/19.106275

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Two-dimensional (2-D) excess-carrier distributions, in a gate turn-off thyristor (GTO) are measured by a time-resolved infrared-absorption technique. The optical scanning system employs a wide memory digital oscilloscope for data acquisition, and a computer system for control, data processing, and display. Maps of the carrier distribution in the active GTO device are produced under steady-state conditions as well as during turn-on and turn-off operation. The maps are presented as three-dimensional (3-D) views produced from 2-D measurements. © 1990 IEEE

引用

页码：473 / 478

页数：6

共 10 条

[1]

BJORKMAN J, 1988, THESIS UPPSALA U

[2]

BLEICHNER H, 1990, APR P ISPSD 90 TOK

[3]

BLEICHNER H, 1988, 1988 IEDM, P614

[4] RADIATIVE RECOMBINATION RATE IN SILICON [J].