RESISTANCE MEASUREMENTS AND VORTEX FLUCTUATIONS IN TWO-DIMENSIONAL SUPERCONDUCTING FILMS

被引：10

作者：

GRAY, KE

BRORSON, J

BANCEL, PA

机构：

[1] Argonne Natl Lab, Materials Science, & Technology Div, Argonne, IL,, USA, Argonne Natl Lab, Materials Science & Technology Div, Argonne, IL, USA

来源：

JOURNAL OF LOW TEMPERATURE PHYSICS | 1985年 / 59卷 / 5-6期

关键词：

ALUMINUM AND ALLOYS - Thin Films - ELECTRIC MEASUREMENTS - Resistance;

D O I：

10.1007/BF00682448

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Recently theories of vortex fluctuations in two-dimensional superconducting films have been compared to the experimentally determined power law dependence of voltage on current and to the temperature-dependent resistance in small applied fields. Here an alternative interpretation of the power law and a practical difficulty of flux pinning for measurements in small fields are pointed out. To illlustrate these points, experimental examples are presented for very homogeneous granular aluminum films.

引用

页码：529 / 545

页数：17

共 37 条

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