MICROWAVE SURFACE-RESISTANCE AND POWER DEPENDENCE OF THALLIUM-BASED FILMS DEPOSITED ONTO LARGE-AREA SILVER SUBSTRATES

被引：17

作者：

COOKE, DW

GRAY, ER

ARENDT, PN

BENNETT, BL

BROWN, DR

ELLIOTT, NE

KLAPETZKY, AJ

REEVES, GA

PORTIS, AM

机构：

[1] Los Alamos National Laboratory, Los Alamos, 87545, New Mexico

[2] University of California at Berkeley, Berkeley, 94720, California

来源：

JOURNAL OF SUPERCONDUCTIVITY | 1990年 / 3卷 / 03期

关键词：

field dependence of surface resistance; High-temperature superconductivity; metallic substrates; microwave surface impedance; Tl-based superconducting films;

D O I：

10.1007/BF00625266

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Microwave surface resistance (Rs) measurements on large-area (11.4 cm2) Tl-based films deposited onto Ag (Consil 995) substrates have been made at a frequency of 18 GHz as a function of temperature. Deposition onto unoriented Ag substrates yields unoriented films characterized by Rs values of 8.2 and 33.6 mΩ at 10.6 and 77 K, respectively. In contrast, similar deposition onto oriented Ag substrates yields oriented films with values of 12.6 and 14.6 mΩ at 11.2 and 77 K, respectively; corresponding Cu values are 9 and 21 mΩ. Additionally, it is found that the dependence of Rs on microwave surface magnetic field Hs is weaker for the oriented films. These results suggest that the effect of orienting the c-axis in Tl films is twofold: (1) the high-frequency superconducting transition is made considerably sharper, resulting in a lower Rs value at 77 K, and (2) the rate of increase in Rs with applied Hs is reduced. Both effects have significant ramifications for the potential application of these materials to high-frequency accelerating cavities. © 1990 Plenum Publishing Corporation.

引用

页码：261 / 267

页数：7

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