DEVELOPMENT OF A NEW TYPE OF SELF-SCANNED ELECTRON IMAGE SENSING INTEGRATED-CIRCUIT

被引：11

作者：

HATFIELD, JV ^{[1
]}

YORK, TA ^{[1
]}

COMER, J ^{[1
]}

HICKS, PJ ^{[1
]}

机构：

[1] UNIV MANCHESTER,DEPT PHYS,MANCHESTER M13 9PL,LANCS,ENGLAND

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1989年 / 24卷 / 03期

关键词：

D O I：

10.1109/4.32029

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：704 / 710

页数：7

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