THE X-RAY TOPOGRAPHY STATION AT DARESBURY LABORATORY

[1] Bowen D. K., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P506

[2] TENSILE STAGE FOR X-RAY TOPOGRAPHY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10): : 868 - 870

[3] EVIDENCE OF INTERACTIONS BETWEEN DOMAIN-WALLS AND A DISLOCATION BUNDLE IN SYNCHROTRON X-RADIATION TOPOGRAPHS OF IRON WHISKER CRYSTALS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) : 1389 - 1390

[4] Chikawa J., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P368

[5] X-RAY TOPOGRAPHIC ASSESSMENT OF FLUX-GROWN CRYSTALS OF RARE-EARTH GERMANATES (R2GE2O7) [J]. JOURNAL OF MATERIALS SCIENCE, 1980, 15 (05) : 1328 - 1330

[6] Hart M., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P421

[7] FLUORESCENT SCREENS FOR HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (03) : 568 - 570

[8] Hartmann W., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P497

[9] APPLICATION OF X-RAY SYNCHROTRON TOPOGRAPHY TO INSITU STUDIES OF RECRYSTALLIZATION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 40 - 43

[10] MACCORMACK IB, 1981, IEEE T MAGNETICS P I

[1] Bowen D. K., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P506

[2] TENSILE STAGE FOR X-RAY TOPOGRAPHY [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (10): : 868 - 870

[3] EVIDENCE OF INTERACTIONS BETWEEN DOMAIN-WALLS AND A DISLOCATION BUNDLE IN SYNCHROTRON X-RADIATION TOPOGRAPHS OF IRON WHISKER CRYSTALS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) : 1389 - 1390

[4] Chikawa J., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P368

[5] X-RAY TOPOGRAPHIC ASSESSMENT OF FLUX-GROWN CRYSTALS OF RARE-EARTH GERMANATES (R2GE2O7) [J]. JOURNAL OF MATERIALS SCIENCE, 1980, 15 (05) : 1328 - 1330

[6] Hart M., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P421

[7] FLUORESCENT SCREENS FOR HIGH-RESOLUTION REAL-TIME X-RAY TOPOGRAPHY [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (03) : 568 - 570

[8] Hartmann W., 1980, Characterization of Crystal Growth Defects by X-Ray Methods. Proceedings of the NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods, P497

[9] APPLICATION OF X-RAY SYNCHROTRON TOPOGRAPHY TO INSITU STUDIES OF RECRYSTALLIZATION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (FEB) : 40 - 43

[10] MACCORMACK IB, 1981, IEEE T MAGNETICS P I