A STUDY OF THE OPTICAL-PROPERTIES OF AMORPHOUS THIN-FILMS OF GERMANIUM AND SILICON MONOXIDE

被引：6

作者：

ALANI, SKJ

HOGARTH, CA

ABEYSURIYA, SWDB

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1985年 / 20卷 / 07期

关键词：

D O I：

10.1007/BF00556086

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2541 / 2548

页数：8

共 18 条

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[3]

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[7]

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[8] REFRACTIVE INDICES OF EVAPORATED CERIUM DIOXIDE-CERIUM FLUORIDE FILMS [J].

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[9] THE OPTICAL-ABSORPTION EDGE IN AMORPHOUS THIN-FILMS OF GERMANIA AND OF GERMANIA WITH BARIUM OXIDE [J].

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NADEEM, MY .

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[10]

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