MAGNETIC PRISM SPECTROMETER FOR A HIGH-VOLTAGE ELECTRON-MICROSCOPE

被引：8

作者：

DARLINGTON, EH ^{[1
]}

SPARROW, TG ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,CAVENDISH LAB,CAMBRIDGE CB2 3RQ,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1975年 / 8卷 / 07期

关键词：

D O I：

10.1088/0022-3735/8/7/018

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：596 / 600

页数：5

共 16 条

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[7] COTTE M, 1938, ANN PHYSIQUE, V10, P364
[8] HIGH RESOLUTION ELECTRON SPECTROMETER FOR USE IN TRANSMISSION SCANNING ELECTRON MICROSCOPY
CREWE, AV
ISAACSON, M
JOHNSON, D
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (04) : 411 - &
[9] 2-DIRECTIONAL FOCUSING OF CHARGED PARTICLES WITH A SECTOR-SHAPED, UNIFORM MAGNETIC FIELD
CROSS, WG
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (10) : 717 - 722
[10] GRIVET P, 1972, ELECTRON OPTICS, P324