CORRECTION

[1] PHOTOTHERMAL MODULATION OF THE GAP DISTANCE IN SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1986, 49 (03) : 137 - 139

[2] AMER NM, 1988, B AM PHYS SOC, V33, P319

[3] AMER NM, 1983, J PHYS PARIS, P185

[4] AMER NM, 1983, SURF SCI, V132, P141

[5] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[6] A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1320 - 1323

[7] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406

[8] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 221 - 224

[9] MEASUREMENT OF VANDERWAALS DISPERSION FORCES IN RANGE 1.5 TO 130 NM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1972, 331 (1584) : 19 - +

[10] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729

[1] PHOTOTHERMAL MODULATION OF THE GAP DISTANCE IN SCANNING TUNNELING MICROSCOPY [J]. APPLIED PHYSICS LETTERS, 1986, 49 (03) : 137 - 139

[2] AMER NM, 1988, B AM PHYS SOC, V33, P319

[3] AMER NM, 1983, J PHYS PARIS, P185

[4] AMER NM, 1983, SURF SCI, V132, P141

[5] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[6] A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1320 - 1323

[7] EXPERIMENTAL-OBSERVATION OF FORCES ACTING DURING SCANNING TUNNELING MICROSCOPY [J]. PHYSICAL REVIEW LETTERS, 1986, 57 (19) : 2403 - 2406

[8] SCANNING TUNNELING MICROSCOPE COMBINED WITH A SCANNING ELECTRON-MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (02) : 221 - 224

[9] MEASUREMENT OF VANDERWAALS DISPERSION FORCES IN RANGE 1.5 TO 130 NM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1972, 331 (1584) : 19 - +

[10] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE [J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729