SOME CHARACTERISTICS OF A COMMERCIAL ECHELLE SPECTROMETER

[1] ESTABLISHMENT OF COMPROMISE CONDITIONS FOR MULTIELEMENT ANALYSIS BY INDUCTIVELY COUPLED PLASMA EMISSION SPECTROMETRY - PRELIMINARY-REPORT [J]. APPLIED SPECTROSCOPY, 1978, 32 (04) : 372 - 377

[2] SIMULTANEOUS DETERMINATION OF 5 TRACE-METALS IN SEAWATER BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY WITH ULTRASONIC NEBULIZATION [J]. ANALYTICAL CHEMISTRY, 1980, 52 (03) : 488 - 492

[3] HIGH-RESOLUTION SPECTROSCOPY USING AN ECHELLE SPECTROMETER WITH PREDISPERSER .1. CHARACTERISTICS OF THE INSTRUMENT AND APPROACH FOR MEASURING PHYSICAL LINE WIDTHS IN AN INDUCTIVELY COUPLED PLASMA [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (9-11) : 1239 - 1260

[4] BOUMANS PWJM, 1984, SPECTROCHIM ACTA B, V39, P1261, DOI 10.1016/0584-8547(84)80211-6

[5] HIGH-RESOLUTION SPECTROSCOPY USING AN ECHELLE SPECTROMETER WITH PREDISPERSER .3. A STUDY OF LINE WINGS AS A MAJOR CONTRIBUTION TO THE BACKGROUND IN LINE-RICH SPECTRA EMITTED BY AN INDUCTIVELY COUPLED PLASMA [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (9-11) : 1291 - 1305

[6] BLAZE CHARACTERISTICS OF ECHELLE GRATINGS [J]. APPLIED OPTICS, 1982, 21 (23): : 4356 - 4362

[7] FIGURES OF MERIT FOR AN ICP-ECHELLE SPECTROMETER SYSTEM [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1982, 37 (10) : 859 - 868

[8] THE PRODUCTION OF DIFFRACTION GRATINGS .2. THE DESIGN OF ECHELLE GRATINGS AND SPECTROGRAPHS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 522 - 528

[9] DETERMINATION OF RARE-EARTHS IN LANTHANUM OXIDE BY INDUCTIVELY-COUPLED PLASMA EMISSION DERIVATIVE SPECTROMETRY [J]. TALANTA, 1983, 30 (02) : 111 - 115

[10] DEVELOPMENT OF A HIGH-RESOLUTION INDUCTIVELY-COUPLED ARGON PLASMA APPARATUS FOR DERIVATIVE SPECTROMETRY AND ITS APPLICATION TO THE DETERMINATION OF HAFNIUM IN HIGH-PURITY ZIRCONIUM-OXIDE [J]. TALANTA, 1982, 29 (04) : 243 - 248

[1] ESTABLISHMENT OF COMPROMISE CONDITIONS FOR MULTIELEMENT ANALYSIS BY INDUCTIVELY COUPLED PLASMA EMISSION SPECTROMETRY - PRELIMINARY-REPORT [J]. APPLIED SPECTROSCOPY, 1978, 32 (04) : 372 - 377

[2] SIMULTANEOUS DETERMINATION OF 5 TRACE-METALS IN SEAWATER BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION-SPECTROMETRY WITH ULTRASONIC NEBULIZATION [J]. ANALYTICAL CHEMISTRY, 1980, 52 (03) : 488 - 492

[3] HIGH-RESOLUTION SPECTROSCOPY USING AN ECHELLE SPECTROMETER WITH PREDISPERSER .1. CHARACTERISTICS OF THE INSTRUMENT AND APPROACH FOR MEASURING PHYSICAL LINE WIDTHS IN AN INDUCTIVELY COUPLED PLASMA [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (9-11) : 1239 - 1260

[4] BOUMANS PWJM, 1984, SPECTROCHIM ACTA B, V39, P1261, DOI 10.1016/0584-8547(84)80211-6

[5] HIGH-RESOLUTION SPECTROSCOPY USING AN ECHELLE SPECTROMETER WITH PREDISPERSER .3. A STUDY OF LINE WINGS AS A MAJOR CONTRIBUTION TO THE BACKGROUND IN LINE-RICH SPECTRA EMITTED BY AN INDUCTIVELY COUPLED PLASMA [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1984, 39 (9-11) : 1291 - 1305

[6] BLAZE CHARACTERISTICS OF ECHELLE GRATINGS [J]. APPLIED OPTICS, 1982, 21 (23): : 4356 - 4362

[7] FIGURES OF MERIT FOR AN ICP-ECHELLE SPECTROMETER SYSTEM [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1982, 37 (10) : 859 - 868

[8] THE PRODUCTION OF DIFFRACTION GRATINGS .2. THE DESIGN OF ECHELLE GRATINGS AND SPECTROGRAPHS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1949, 39 (07) : 522 - 528

[9] DETERMINATION OF RARE-EARTHS IN LANTHANUM OXIDE BY INDUCTIVELY-COUPLED PLASMA EMISSION DERIVATIVE SPECTROMETRY [J]. TALANTA, 1983, 30 (02) : 111 - 115

[10] DEVELOPMENT OF A HIGH-RESOLUTION INDUCTIVELY-COUPLED ARGON PLASMA APPARATUS FOR DERIVATIVE SPECTROMETRY AND ITS APPLICATION TO THE DETERMINATION OF HAFNIUM IN HIGH-PURITY ZIRCONIUM-OXIDE [J]. TALANTA, 1982, 29 (04) : 243 - 248