DIRECT ATOMIC EMISSION DETERMINATION OF SOME TRACE-METALS IN SOLID POWDER SAMPLES WITH A MAGNETICALLY TAILORED CAPACITIVE DISCHARGE PLASMA

被引：15

作者：

ALBERS, D ^{[1
]}

SACKS, R ^{[1
]}

机构：

[1] UNIV MICHIGAN,DEPT CHEM,ANN ARBOR,MI 48109

来源：

ANALYTICAL CHEMISTRY | 1987年 / 59卷 / 04期

关键词：

D O I：

10.1021/ac00131a012

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：593 / 597

页数：5

共 15 条

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[2]

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[3]

ALBERS D, IN PRESS SPECTROCHIM

[4]

Boyd T. J., 1969, PLASMA DYNAMICS

[5]

CHEN F, 1974, INTRO PLASMA PHYSICS

[6] DIRECT DETERMINATION OF SELECTED METALS IN REFRACTORY POWDER MICRO SAMPLES WITH EXPLODING THIN-FILM EXCITATION [J].

CLARK, EM ;

SACKS, RD .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1980, 35 (08) :471-488

[7]

COLLINS R, 1983, ANAL CHEM, V55, P2179

[8] EMISSION SPECTROSCOPY OF TRACE IMPURITIES IN POWDERED SAMPLES WITH A HIGH-FREQUENCY ARGON PLASMA TORCH [J].

DAGNALL, RM ;

SMITH, DJ ;

WEST, TS ;

GREENFIE.S .

ANALYTICA CHIMICA ACTA, 1971, 54 (03) :397-&

[9] PREPARATION AND CHARACTERIZATION OF THIN METAL-FILMS FOR EXPLODING-CONDUCTOR EXCITATION [J].

DUCHANE, DV ;

SACKS, RD .

ANALYTICAL CHEMISTRY, 1978, 50 (13) :1752-1757

[10] DIRECT DETERMINATION OF METALLIC ELEMENTS IN SOLID, POWDER SAMPLES WITH ELECTRICALLY VAPORIZED THIN-FILM ATOMIC EMISSION-SPECTROMETRY [J].

GOLDBERG, J ;

SACKS, R .

ANALYTICAL CHEMISTRY, 1982, 54 (13) :2179-2186

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