INVESTIGATION OF DEEP LEVELS IN EPITAXIALLY GROWN CDS AND CDTE LAYERS

被引:15
作者
SITTER, H
AS, D
HUMENBERGER, J
LOPEZOTERO, A
机构
关键词
D O I
10.1016/0022-0248(82)90329-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
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页码:229 / 233
页数:5
相关论文
共 14 条
[1]   DEEP LEVEL DEFECTS IN POLYCRYSTALLINE CADMIUM-SULFIDE [J].
BESOMI, P ;
WESSELS, B .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (08) :4305-4309
[2]  
Frenkel J, 1938, PHYS REV, V54, P647, DOI 10.1103/PhysRev.54.647
[3]  
Frenkel J., 1938, TECH PHYS USSR, V5, P685
[4]   DEFECT STRUCTURE OF CDTE [J].
KROGER, FA .
REVUE DE PHYSIQUE APPLIQUEE, 1977, 12 (02) :205-210
[5]   DEEP-LEVEL TRANSIENT SPECTROSCOPY - NEW METHOD TO CHARACTERIZE TRAPS IN SEMICONDUCTORS [J].
LANG, DV .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3023-3032
[6]   FAST CAPACITANCE TRANSIENT APPARATUS - APPLICATION TO ZNO AND O CENTERS IN GAP PARANORMAL JUNCTIONS [J].
LANG, DV .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (07) :3014-3022
[7]   DOUBLE CORRELATION TECHNIQUE (DDLTS) FOR ANALYSIS OF DEEP LEVEL PROFILES IN SEMICONDUCTORS [J].
LEFEVRE, H ;
SCHULZ, M .
APPLIED PHYSICS, 1977, 12 (01) :45-53
[8]   HOT WALL EPITAXY [J].
LOPEZOTERO, A .
THIN SOLID FILMS, 1978, 49 (01) :3-57
[9]   CAPACITANCE TRANSIENT SPECTROSCOPY [J].
MILLER, GL ;
LANG, DV ;
KIMERLING, LC .
ANNUAL REVIEW OF MATERIALS SCIENCE, 1977, 7 :377-448
[10]   DEEP-LEVEL TRANSIENT SPECTROSCOPY STUDIES OF NI-DIFFUSED AND ZN-DIFFUSED VAPOR-PHASE EPITAXY N-GAAS [J].
PARTIN, DL ;
CHEN, JW ;
MILNES, AG ;
VASSAMILLET, LF .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6845-6859