A MICHELSON INTERFEROMETER WITH BALANCED DETECTION FOR THE CHARACTERIZATION OF MODULATION AND NOISE PROPERTIES OF SEMICONDUCTOR-LASERS

被引:13
作者
GOOBAR, E
机构
[1] Department of Microwave Engineering, Royal Institute of Technology (KTH), S-100 44, Stockholm
关键词
D O I
10.1109/3.214498
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A Michelson interferometer with balanced detection for the studies of modulation and noise properties of semiconductor lasers is built and analyzed. The quantum noise due to vacuum fluctuations, coupling losses, detector quantum efficiency, and spatial mode mismatches is included in the analysis. The limits for the frequency noise detection and the sensitivity of the interferometer are examined. It is observed that under ordinary measurement conditions the frequency noise can only be measured up to slightly above the cavity bandwidth of the laser. Finally, comprehensive measurement procedures are proposed, and experimental results showing the frequency modulation response, measured from 10 kHz to 8 GHz of a three-section DFB laser, and frequency noise spectra, measured from 30 MHz to 8 GHz, of a two-section DBR laser are presented. These results reveal new cavity detuning effects in the noise characteristics of tunable DBR lasers.
引用
收藏
页码:1116 / 1130
页数:15
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