STRUCTURAL STUDIES OF II-VI SEMICONDUCTORS AT HIGH-PRESSURE

被引：64

作者：

NELMES, RJ

MCMAHON, MI

WRIGHT, NG

ALLAN, DR

机构：

[1] Department of Physics and Astronomy, The University of Edinburgh, Edinburgh, EH9 3JZ, Mayfield Road

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 1995年 / 56卷 / 3-4期

关键词：

SEMICONDUCTORS; X-RAY DIFFRACTION; HIGH PRESSURE; PHASE TRANSITIONS;

D O I：

10.1016/0022-3697(94)00235-5

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Extensive new structural results on II-VI, III-V and group IV semiconductors under pressure have been obtained over the past two years at SRS Daresbury, using angle-dispersive techniques and an image-plate detector. In this paper, a brief overview is presented of recent work on ZnTe, CdTe, HgTe, HgS.

引用

页码：545 / 549

页数：5

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