XPS STUDY IN CEAG AND EUCU2SI2 AT LOW-TEMPERATURES DOWN TO 4-K

被引：11

作者：

TAKIGAWA, Y ^{[1
]}

NOGUCHI, S ^{[1
]}

OKUDA, K ^{[1
]}

机构：

[1] UNIV OSAKA PREFECTURE,DEPT ELECTR,SAKAI,OSAKA 591,JAPAN

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1988年 / 76-7卷

关键词：

Electronic Properties - Photoemission - Spectroscopy; X-Ray;

D O I：

10.1016/0304-8853(88)90418-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Electronic structure of CeAg and EuCu2Si2 was investigated by XPS measurements in a temperature range from 3.7 to 300 K. When the temperature was decreased, the mixing ratio of Eu3+/ Eu2+ in EuCu2Si2 was increased showing a maximum near 50 K and then decreased. XPS measurements were done by using a combined type of spectrometer (Shimazu ASIX-1000) with the Mg-Kα line (1253.6 eV) as an exciting source. The spectrometer has four functions: XPS (X-ray photoemission spectroscopy), AES (auger-electron spectroscopy), SIMS (secondary ion mass spectroscopy) and ISS (ion scattering spectroscopy).

引用

页码：345 / 346

页数：2

共 6 条

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