DEFECT IDENTIFICATION IN VAPOR-GROWN BETA-SIC WHISKERS

被引:19
作者
IWANAGA, H
YOSHIIE, T
KATUKI, H
EGASHIRA, M
TAKEUCHI, S
机构
[1] NAGASAKI UNIV,FAC LIBERAL ARTS,NAGASAKI 852,JAPAN
[2] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN
关键词
D O I
10.1007/BF01729284
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:946 / 948
页数:3
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