DEFECT IDENTIFICATION IN VAPOR-GROWN BETA-SIC WHISKERS

被引：19

作者：

IWANAGA, H

YOSHIIE, T

KATUKI, H

EGASHIRA, M

TAKEUCHI, S

机构：

[1] NAGASAKI UNIV,FAC LIBERAL ARTS,NAGASAKI 852,JAPAN

[2] UNIV TOKYO,INST SOLID STATE PHYS,MINATO KU,TOKYO 106,JAPAN

来源：

关键词：

D O I：

10.1007/BF01729284

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：946 / 948

页数：3

共 6 条

[1]

Egashira M., 1985, Yogyo-Kyokai-Shi, V93, P535, DOI 10.2109/jcersj1950.93.1081_535

ISHIDA, Y ;

ISHIDA, H ;

KOHRA, K ;

ICHINOSE, H .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1980, 42 (04) :453-462

[3]

KIRCHNER HP, 1963, J AM CERAM SOC, V46, P209

[4]

KNIPPENBERG WF, 1962, PHILIPS TECH REV, V24, P181

[5] INFLUENCE OF OXYGEN ON GROWTH OF 2H-SIC WHISKERS [J].

SETAKA, N ;

EJIRI, K .

[6]

VANTORNE LI, 1966, J APPL PHYS, V37, P1948