ISS DEPTH PROFILE ANALYSIS OF ANODIZED NIOBIUM

[1] BAUER W, 1972, P APPL SUPERCONDUCTI, P653

[2] EDDY-CURRENT METHOD FOR MEASURING THE RESISTIVITY OF METALS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1976 - 1980

[3] HIGH-PERFORMANCE NB HELICAL CAVITY [J]. IEEE TRANSACTIONS ON MAGNETICS, 1975, MA11 (02) : 413 - 416

[4] BENAROYA R, 1972, P PROT LIN ACC C OCT, P168

[5] CONTAMINATION OF NIOBIUM IN OXYGEN DURING TREATMENT OF ELECTROLYTE POLISHING AND ANNEALING IN A VACUUM [J]. REVUE DE PHYSIQUE APPLIQUEE, 1970, 5 (03): : 383 - &

[6] Oxide of niobium [J]. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1941, 248 (01): : 1 - 31

[7] NOTE ON THICKNESSES OF ANODIZED NIOBIUM OXIDE FILMS [J]. THIN SOLID FILMS, 1971, 8 (04) : R37 - &

[8] SUPERCONDUCTING NIOBIUM TEO11 MODE CAVITIES WITH HIGH CRITICAL MAGNETIC-FIELD AND HIGH Q VALUE [J]. PHYSICS LETTERS A, 1972, A 38 (05) : 337 - &

[9] DIEPERS H, 1971, PHYS LETT A, V34, P439

[10] ELLIOTT P, 1959, T AM SOC METALS, V52, P990

[1] BAUER W, 1972, P APPL SUPERCONDUCTI, P653

[2] EDDY-CURRENT METHOD FOR MEASURING THE RESISTIVITY OF METALS [J]. JOURNAL OF APPLIED PHYSICS, 1959, 30 (12) : 1976 - 1980

[3] HIGH-PERFORMANCE NB HELICAL CAVITY [J]. IEEE TRANSACTIONS ON MAGNETICS, 1975, MA11 (02) : 413 - 416

[4] BENAROYA R, 1972, P PROT LIN ACC C OCT, P168

[5] CONTAMINATION OF NIOBIUM IN OXYGEN DURING TREATMENT OF ELECTROLYTE POLISHING AND ANNEALING IN A VACUUM [J]. REVUE DE PHYSIQUE APPLIQUEE, 1970, 5 (03): : 383 - &

[6] Oxide of niobium [J]. ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE, 1941, 248 (01): : 1 - 31

[7] NOTE ON THICKNESSES OF ANODIZED NIOBIUM OXIDE FILMS [J]. THIN SOLID FILMS, 1971, 8 (04) : R37 - &

[8] SUPERCONDUCTING NIOBIUM TEO11 MODE CAVITIES WITH HIGH CRITICAL MAGNETIC-FIELD AND HIGH Q VALUE [J]. PHYSICS LETTERS A, 1972, A 38 (05) : 337 - &

[9] DIEPERS H, 1971, PHYS LETT A, V34, P439

[10] ELLIOTT P, 1959, T AM SOC METALS, V52, P990