SILICON PHOTO-DIODE ABSOLUTE SPECTRAL RESPONSE SELF-CALIBRATION USING A FILTERED TUNGSTEN SOURCE

被引:10
作者
HUGHES, CG
机构
来源
APPLIED OPTICS | 1982年 / 21卷 / 12期
关键词
D O I
10.1364/AO.21.002129
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2129 / 2132
页数:4
相关论文
共 3 条
[1]  
FOWLER JB, 1979, NBS987 US TECH NOT
[2]   QUANTUM EFFICIENCY OF THE P-N-JUNCTION IN SILICON AS AN ABSOLUTE RADIOMETRIC STANDARD [J].
GEIST, J .
APPLIED OPTICS, 1979, 18 (06) :760-762
[3]   SILICON PHOTO-DIODE ABSOLUTE SPECTRAL RESPONSE SELF-CALIBRATION [J].
ZALEWSKI, EF ;
GEIST, J .
APPLIED OPTICS, 1980, 19 (08) :1214-1216