EXCIMER-LASER-INDUCED CRYSTALLIZATION OF HYDROGENATED AMORPHOUS-SILICON

被引:35
作者
WINER, K [1 ]
ANDERSON, GB [1 ]
READY, SE [1 ]
BACHRACH, RZ [1 ]
JOHNSON, RI [1 ]
PONCE, FA [1 ]
BOYCE, JB [1 ]
机构
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
关键词
D O I
10.1063/1.103897
中图分类号
O59 [应用物理学];
学科分类号
摘要
The electronic transport properties and structural morphology of fast-pulse excimer-laser- crystallized hydrogenated amorphous silicon (a-Si:H) thin films have been measured. The room-temperature dark dc conductivities and Hall mobilities increase by several orders of magnitude at well-defined laser energy density thresholds which decrease as the impurity concentration in the films increases. The structural morphology of the films suggests an impurity-induced reduction of the a-Si:H melt temperature as the origin of this behavior.
引用
收藏
页码:2222 / 2224
页数:3
相关论文
共 11 条
  • [1] LOW-TEMPERATURE CRYSTALLIZATION OF AMORPHOUS-SILICON USING AN EXCIMER LASER
    BACHRACH, RZ
    WINER, K
    BOYCE, JB
    READY, SE
    JOHNSON, RI
    ANDERSON, GB
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1990, 19 (03) : 241 - 248
  • [2] FERRIS SD, 1979, AIP C P, V50
  • [3] HALL-EFFECT AND IMPURITY CONDUCTION IN SUBSTITUTIONALLY DOPED AMORPHOUS SILICON
    LECOMBER, PG
    JONES, DI
    SPEAR, WE
    [J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (05): : 1173 - 1187
  • [4] NAYARAN J, 1985, J APPL PHYS, V57, P564
  • [5] OLSEN GL, 1984, MATER RES SOC S P, V35, P25
  • [6] SAMESHIMA T, 1986, MATER RES SOC S P, V71, P435
  • [7] MELTING TEMPERATURE AND EXPLOSIVE CRYSTALLIZATION OF AMORPHOUS-SILICON DURING PULSED LASER IRRADIATION
    THOMPSON, MO
    GALVIN, GJ
    MAYER, JW
    PEERCY, PS
    POATE, JM
    JACOBSON, DC
    CULLIS, AG
    CHEW, NG
    [J]. PHYSICAL REVIEW LETTERS, 1984, 52 (26) : 2360 - 2363
  • [8] Tsai C. C., 1988, AMORPHOUS SILICON RE, V1, P123
  • [9] WINER K, 1990, MATER RES SOC SYMP P, V164, P183
  • [10] UNIVERSAL DOPANT AND DEFECT EQUILIBRATION KINETICS IN N-TYPE A-SI-H
    WINER, K
    JACKSON, WB
    [J]. PHYSICAL REVIEW B, 1989, 40 (18): : 12558 - 12561