SIMPLE RESISTANCE MODEL FIT TO THE OXIDATION OF A VANADIUM FILM INTO VO2

被引：13

作者：

CASE, FC

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 1988年 / 6卷 / 01期

关键词：

D O I：

10.1116/1.574993

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：123 / 127

页数：5

共 8 条

CASE, FC .

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[2] 2 COMPONENTS OF CRYSTALLOGRAPHIC TRANSITION IN VO2 [J].

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GULBRANSEN, EA ;

ANDREW, KF .

[4] ELECTRICAL CONDUCTIVITY OF VANADIUM OXIDES [J].

KACHI, S ;

TAKADA, T ;

KOSUGE, K .

[5] PHASE DIAGRAM AND PHASE TRANSITION OF V2O3-V2O5 SYSTEM [J].

KOSUGE, K .

MORIN, FJ .

[7] MEASUREMENT OF SHEET RESISTIVITIES WITH THE 4-POINT PROBE [J].

SMITS, FM .

BELL SYSTEM TECHNICAL JOURNAL, 1958, 37 (03) :711-718

[8]

TRIMMIER JR, 1972, LTV B940002TR5 REP