MODEL-CALCULATIONS FOR THE ANALYSIS OF SCATTERING DATA FROM LAYERED STRUCTURES

被引：132

作者：

LOOSE, W

ACKERSON, BJ

机构：

[1] OKLAHOMA STATE UNIV,CTR LASER RES,STILLWATER,OK 74078

[2] OKLAHOMA STATE UNIV,DEPT PHYS,STILLWATER,OK 74078

来源：

JOURNAL OF CHEMICAL PHYSICS | 1994年 / 101卷 / 09期

关键词：

D O I：

10.1063/1.468278

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Model calculations for the interpretation of scattering patterns from layered structures are presented. They assume a rigid configuration of the layers which are then stacked in a deterministic or stochastic manner. Results for stacking faults of close-packed crystals and for sheared sliding layers are presented. The method can easily be applied to other stacking sequences.

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页码：7211 / 7220

页数：10

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