MONITORING SINTERING DENSIFICATION AND CRYSTALLIZATION GRAIN-GROWTH IN TL-BASED HIGH-TEMPERATURE SUPERCONDUCTORS BY ELECTRICAL-CONDUCTIVITY MEASUREMENTS

被引：15

作者：

RATTO, JJ ^{[1
]}

PORTER, JR ^{[1
]}

HOUSLEY, RM ^{[1
]}

MORGAN, PED ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 02期

关键词：

Electrical resistance method; Four point probe method; Grain-growth; High temperature superconductor; Intergrowths; Sintering; Syntactic; TI-Ba-Ca-Cu-0; Tl-2201; Tl-2212; Tl-2223;

D O I：

10.1143/JJAP.29.244

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An “in situ” electrical resistance method has been used to monitor sintering to best achieve a high percentage of Tl-2223 structure. By this means, the sequential formation of syntactic intergrowths, 2201, 2212 and 2223 structures, was followed as a function of temperature, time, seeding and gaseous atmosphere. At 895°C, slight melting assists the formation of ∼95% pure 2223; the presence of carbonate is probably deleterious. © 1990 The Japan Society of Applied Physics.

引用

页码：244 / 251

页数：8

共 24 条

[1] CRYSTALLIZATION OF TE100-XTLX ALLOYS (15LESS-THAN-OR-EQUAL-TO X LESS-THAN-OR-EQUAL-TO50) OBTAINED BY RAPID COOLING FROM LIQUID STATE [J].