TEM STUDY OF SUBTHRESHOLD ELECTRON-IRRADIATION DAMAGE IN II-VI COMPOUNDS

被引：14

作者：

LOGINOV, YY ^{[1
]}

BROWN, PD ^{[1
]}

THOMPSON, N ^{[1
]}

机构：

[1] UNIV DURHAM,SCH ENGN & APPL SCI,APPL PHYS GRP,DURHAM DH1 3LE,ENGLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1991年 / 126卷 / 01期

关键词：

D O I：

10.1002/pssa.2211260107

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Single crystals of ZnS, ZnSe, CdTe, CdS, and epitaxial ZnSe/ZnS are irradiated with a 100 keV electron beam and observed in a conventional transmission electron microscope. The electron beam induced damage observed may be explained in terms of the formation and interaction of point defects arising from the action of a sub-threshold ionization mechanism. Experimental observations are compared with theoretical predictions with consideration being given to the extent of electron beam heating within the samples. The susceptibility to damage from electron beam irradiation is found to vary in order ZnS > CdS > ZnSe > CdTe.

引用

页码：63 / 83

页数：21

共 34 条

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