MICROWAVE MEASUREMENT OF CONDUCTIVITY AND DIELECTRIC CONSTANT OF SEMICONDUCTORS

被引：20

作者：

NAG, BR

CHATTERJI, CK

ROY, SK

机构：

来源：

PROCEEDINGS OF THE IEEE | 1963年 / 51卷 / 06期

关键词：

D O I：

10.1109/PROC.1963.2366

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：962 / +

页数：1

共 10 条

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BENEDICT, TS .

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[2] MICROWAVE OBSERVATION OF THE COLLISION FREQUENCY OF ELECTRONS IN GERMANIUM [J].

BENEDICT, TS ;

SHOCKLEY, W .

PHYSICAL REVIEW, 1953, 89 (05) :1152-1153

[3]

DALTROY F, 1955, PHYS REV, V100, P1260

[4] MICROWAVE DETERMINATION OF THE AVERAGE MASSES OF ELECTRONS AND HOLES IN GERMANIUM [J].

GOLDEY, JM ;

BROWN, SC .

PHYSICAL REVIEW, 1955, 98 (06) :1761-1763

[5]

JACOBS G, 1962 IRE INT CONV RE, P30

[6] ELECTRODELESS MEASUREMENT OF SEMICONDUCTOR RESISTIVITY AT MICROWAVE FREQUENCIES [J].

JACOBS, H ;

BRAND, FA ;

BENJAMIN, R ;

MEINDL, JD ;

BENANTI, M .

PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1961, 49 (05) :928-&

[7]

MARCUVITZ N, 1951, WAVEGUIDE HANDBOOK, V10, P388

[8]

MONTGOMERY CA, 1947, TECHNIQUE MICROWAVE, V11, P625

[9]

NAG BR, 1962, P IRE, V50, P2515

[10]

STUBB T, 1958, 42 STAT I TECH RES H

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