ANALYTICAL APPLICATIONS OF RESONANCE IONIZATION MASS-SPECTROMETRY (RIMS)

被引:22
作者
FASSETT, JD
TRAVIS, JC
机构
关键词
D O I
10.1016/0584-8547(88)80180-0
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:1409 / 1422
页数:14
相关论文
共 101 条
[1]  
AMBARTSUMYAN RV, 1971, JETP LETT, V13, P305
[2]  
Apel E. C., 1987, Resonance Ionization Spectroscopy 1986. Proceedings of the Third International Symposium, P179
[3]   SURFACE-ANALYSIS BY NONRESONANT MULTIPHOTON IONIZATION OF DESORBED OR SPUTTERED SPECIES [J].
BECKER, CH ;
GILLEN, KT .
ANALYTICAL CHEMISTRY, 1984, 56 (09) :1671-1674
[4]   RESONANCE IONIZATION SOURCE FOR MASS-SPECTROSCOPY [J].
BEEKMAN, DW ;
CALLCOTT, TA ;
KRAMER, SD ;
ARAKAWA, ET ;
HURST, GS ;
NUSSBAUM, E .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (1-2) :89-97
[5]  
BEEKMAN DW, 1985, RESONANCE IONIZATION, P143
[6]   LASER RESONANT PHOTOIONIZATION SPECTROSCOPY FOR TRACE ANALYSIS [J].
BEKOV, GI ;
LETOKHOV, VS .
TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 1983, 2 (11) :252-256
[7]  
BEKOV GI, 1978, JETP LETT+, V27, P47
[8]  
BENNINGHOVEN A, 1986, SESCONDARY ION MAS 3, V5, P70
[9]  
BENNINGHOVEN A, 1986, SECONDARY ION MASS S
[10]  
BENNINGHOVEN A, 1987, SECONARDY ION MASS S