SCANNING MICROSCOPY THROUGH THICK LAYERS BASED ON LINEAR CORRELATION

被引：23

作者：

KEMPE, M

RUDOLPH, W

机构：

[1] Department of Physics and Astronomy, University of New Mexico, Albuquerque, NM

来源：

OPTICS LETTERS | 1994年 / 19卷 / 23期

关键词：

D O I：

10.1364/OL.19.001919

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Scanning microscopy in combination with an interferometric correlation technique that uses short light pulses or broadband cw light is shown to permit enhanced depth discrimination, which is particularly useful for imaging through thick layers introducing spherical aberration and through scattering media.

引用

页码：1919 / 1921

页数：3

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