DETERMINATION OF THE PARAMETERS OF THE CRYSTALLIZATION OF THIN-LAYERS OF AMORPHOUS SELENIUM BY OPTICAL MICROSCOPY

被引：3

作者：

ATMANI, H

MICHON, P

VAUTIER, C

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 75卷 / 01期

关键词：

D O I：

10.1002/pssa.2210750142

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K5 / &

共 13 条

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