RESOLUTION IN NONLINEAR LASER-SCANNING MICROSCOPY

被引:18
作者
DEITCHE, J [1 ]
KEMPE, M [1 ]
RUDOLPH, W [1 ]
机构
[1] UNIV NEW MEXICO,DEPT PHYS & ASTRON,ALBUQUERQUE,NM 87131
来源
JOURNAL OF MICROSCOPY-OXFORD | 1994年 / 174卷
关键词
SCANNING MICROSCOPY; NONLINEAR MICROSCOPY;
D O I
10.1111/j.1365-2818.1994.tb03450.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
The lateral and depth resolution of nonlinear microscopy was studied systematically. Nonlinear microscopy can be classified into several categories depending on the coherence properties of the process that generates the imaging signal from the illuminating light, on whether a single- or a two-beam geometry is used, and whether the optical setup is Type I or Type IT, An evaluation of the imaging equations shows that (i) lateral and depth resolution improve with increasing nonlinearity, (ii) the differences between coherent and incoherent imaging diminish, and (iii) nonlinear imaging allows depth discrimination in Type I microscopy.
引用
收藏
页码:69 / 73
页数:5
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