IN-SITU STRAINING EXPERIMENTS IN WEAK-BEAM CONDITIONS

被引：6

作者：

CAILLARD, D

COURET, A

MOLENAT, G

CRESTOU, J

机构：

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1993年 / 4卷 / 2-3期

关键词：

D O I：

10.1051/mmm:0199300402-3018300

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In situ straining experiments are described in some typical situations where the resolution of weak-beam is needed. Surface effects are shown to be unimportant, although the foil thickness is less than those in the classical bright field conditions.

引用

页码：183 / 190

页数：8

共 23 条

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