A TIME-DOMAIN METHOD FOR CHARACTERIZING THE REFLECTION COEFFICIENT OF ABSORBING MATERIALS FROM 30-MHZ TO 1000-MHZ

被引：15

作者：

TOFANI, S ^{[1
]}

ONDREJKA, A ^{[1
]}

KANDA, M ^{[1
]}

机构：

[1] NATL INST STAND & TECHNOL,DIV ELECTROMAGNET FIELDS,BOULDER,CO 80303

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 1991年 / 33卷 / 03期

关键词：

ABSORBER; MICROWAVES; REFLECTIVITY; REFLECTOMETER; RF; TIME DOMAIN;

D O I：

10.1109/15.85137

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A wideband time-domain reflectometer is used to evaluate the reflection characteristics of RF/microwave absorbers. The reflectometer uses an array of two identical broad-band antennas (both transmitting and receiving). The two antennas are used in a difference mode to remove the undesired signals and enhance the small reflections being measured. Using this technique, we can separate the target surface reflections from those generated outside the target area. The bandwidth of our pulses is 30 to 1000 MHz, and the reflection coefficient is measured over this range. The method has been used to characterize the reflectivity of three different types of absorber placed in an anechoic chamber. The results are reported together with a discussion of the main sources of errors.

引用

页码：234 / 240

页数：7