THE INFLUENCE OF ANIONS ON THE STRUCTURE OF UNDERPOTENTIALLY DEPOSITED CU ON AU(111) - A LEED, RHEED AND AES STUDY

被引:154
作者
ZEI, MS
QIAO, G
LEHMPFUHL, G
KOLB, DM
机构
[1] Max-Planck-Gesellschaft, Berlin, West Ger, Max-Planck-Gesellschaft, Berlin, West Ger
来源
BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 1987年 / 91卷 / 04期
关键词
D O I
10.1002/bbpc.19870910423
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
14
引用
收藏
页码:349 / 353
页数:5
相关论文
共 14 条
  • [1] ORDERED OVERLAYER OF LEAD OBTAINED BY UNDERPOTENTIAL DEPOSITION ON PT(100)
    ABERDAM, D
    TRAORE, S
    DURAND, R
    FAURE, R
    [J]. SURFACE SCIENCE, 1987, 180 (01) : 319 - 332
  • [2] BECKMANN HO, 1977, FARADAY S CHEM SOC, V12, P51
  • [3] ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS
    HAGSTROM, S
    NORDLING, C
    SIEGBAHN, K
    [J]. PHYSICS LETTERS, 1964, 9 (03): : 235 - 236
  • [4] UNDERPOTENTIAL DEPOSITION OF LEAD ON SINGLE-CRYSTAL FACES OF GOLD .1. THE INFLUENCE OF CRYSTALLOGRAPHIC ORIENTATION OF THE SUBSTRATE
    HAMELIN, A
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1984, 165 (1-2): : 167 - 180
  • [5] RADIOTRACER STUDY OF THE ADSORPTION OF CL- AND HSO4- IONS ON A POROUS GOLD ELECTRODE AND ON UNDERPOTENTIAL DEPOSITED METALS ON GOLD
    HORANYI, G
    RIZMAYER, EM
    JOO, P
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1983, 152 (1-2) : 211 - 222
  • [6] STUDY OF PLATINUM-ELECTRODES BY MEANS OF THIN-LAYER ELECTROCHEMISTRY AND LOW-ENERGY ELECTRON-DIFFRACTION .1. ELECTRODE SURFACE-STRUCTURE AFTER EXPOSURE TO WATER AND AQUEOUS-ELECTROLYTES
    ISHIKAWA, RM
    HUBBARD, AT
    [J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 1976, 69 (03): : 317 - 338
  • [7] JUTTNER K, 1980, Z PHYS CHEM NEUE FOL, V122, P163
  • [8] Kolb D. M., 1978, ADV ELECTROCHEMISTRY, p[11, 125]
  • [9] KOLB DM, 1986, DECHEMA MONOGR, V102, P53
  • [10] A LEED AND RHEED INVESTIGATION OF CU ON AU(111) IN THE UNDERPOTENTIAL REGION
    NAKAI, Y
    ZEI, MS
    KOLB, DM
    LEHMPFUHL, G
    [J]. BERICHTE DER BUNSEN-GESELLSCHAFT-PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 1984, 88 (04): : 340 - 345