SPECTER - A PROGRAM FOR ULTRA TRACE PIXE ANALYSIS OF THIN TARGETS

被引:7
作者
CECCHI, R [1 ]
FERRARI, MG [1 ]
GHERMANDI, G [1 ]
ROSSI, M [1 ]
机构
[1] UNIV MODENA,IST OSSERV GEOFIS,I-41100 MODENA,ITALY
关键词
D O I
10.1016/0168-583X(90)90232-J
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Based mainly on experimental parameters both in spectrum shape modelling and in K, L, and escape lines intensity and transmission effect evaluation, the program SPECTRE is a PIXE data handling system by linear least-squares fit perfected for trace and ultra trace element analysis in thin targets from chemically treated liquid samples. The element concentrations in the original samples and the measurement errors are calculated by experimental calibration coefficients depending on the target preparation procedure. The program runs in fully automatic or interactive mode on VAX computer with low CPU time consumption. © 1990.
引用
收藏
页码:146 / 151
页数:6
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