DETERMINATION OF SOME TRACE-ELEMENTS IN HIGH-PURITY TANTALUM METAL BY THIN-FILM X-RAY-FLUORESCENCE SPECTROMETRY

被引：4

作者：

EDDY, BT

BALAES, AME

机构：

来源：

X-RAY SPECTROMETRY | 1988年 / 17卷 / 05期

关键词：

D O I：

10.1002/xrs.1300170508

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

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页码：195 / 199

页数：5

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