LOW-ENERGY EXCITATION IN COPPER-ION CONDUCTORS

被引:4
作者
SAKUMA, T
SHIBATA, K
HOSHINO, S
机构
[1] TOHOKU UNIV,INST MAT RES,SENDAI,MIYAGI 980,JAPAN
[2] UNIV TSUKUBA,INST APPL PHYS,TSUKUBA 305,JAPAN
关键词
D O I
10.1016/0167-2738(90)90355-U
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Neutron inelastic scattering of copper ion conductors Cu1.8S, Cu1.8Se and CuI was measured by the time-of-flight (TOF) method at room temperature. Low-lying excitations near h{stroke}ω≃3.4 meV, which had been observed in the measurement in Cu2Se, existed in these copper ion conductors. A relation between the excitation energy and the mass of cations can be represented by h {combining short stroke overlay}ω≃ 1 M. © 1990.
引用
收藏
页码:337 / 340
页数:4
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