SECONDARY-ION EMISSION OF AMINO-ACIDS

被引：266

作者：

BENNINGHOVEN, A ^{[1
]}

JASPERS, D ^{[1
]}

SICHTERMANN, W ^{[1
]}

机构：

[1] UNIV MUNSTER,INST PHYS,D-4400 MUNSTER,FED REP GER

来源：

APPLIED PHYSICS | 1976年 / 11卷 / 01期

关键词：

D O I：

10.1007/BF00895013

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：35 / 39

页数：5

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[1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625
[2] SECONDARY ION YIELDS NEAR 1 FOR SOME CHEMICAL COMPOUNDS
BENNINGHOVEN, A
MUELLER, A
[J]. PHYSICS LETTERS A, 1972, A-40 (02) : 169 - +
[3] SURFACE INVESTIGATION OF SOLIDS BY STATICAL METHOD OF SECONDARY ION MASS SPECTROSCOPY (SIMS)
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1973, 35 (01) : 427 - 457
[4] CALIFORNIUM-252 PLASMA DESORPTION MASS-SPECTROSCOPY
MACFARLANE, RD
TORGERSON, DF
[J]. SCIENCE, 1976, 191 (4230) : 920 - 925
[5] NEW APPROACH TO MASS-SPECTROSCOPY OF NONVOLATILE COMPOUNDS
TORGERSON, DF
SKOWRONSKI, RP
MACFARLANE, RD
[J]. BIOCHEMICAL AND BIOPHYSICAL RESEARCH COMMUNICATIONS, 1974, 60 (02) : 616 - 621