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STEM IMAGING AND ANALYSIS OF SURFACES

被引：15
作者：
COWLEY, JM
KANG, ZC
机构：
来源：
ULTRAMICROSCOPY | 1983年 / 11卷 / 2-3期
关键词：
D O I：
10.1016/0304-3991(83)90228-0
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：131 / 140
页数：10
相关论文
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[3]   ELECTRON MICRO-DIFFRACTION STUDIES OF THE POTENTIAL-FIELD AT CRYSTAL-SURFACES [J].
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[4]   MICRO-DIFFRACTION, STEM IMAGING AND ELS AT CRYSTAL-SURFACES [J].
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[5]   SURFACE ENERGIES AND SURFACE-STRUCTURE OF SMALL CRYSTALS STUDIED BY USE OF A STEM INSTRUMENT [J].
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[10]  
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