MESH EFFECT IN A PARALLEL-PLATE ANALYZER

被引：3

作者：

HAMADA, Y ^{[1
]}

KAWASUMI, Y ^{[1
]}

IGUCHI, H ^{[1
]}

FUJISAWA, A ^{[1
]}

ABE, Y ^{[1
]}

TAKAHASHI, M ^{[1
]}

机构：

[1] IWATE UNIV,FAC ENGN,MORIOKA,IWATE 020,JAPAN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 05期

关键词：

D O I：

10.1063/1.1144900

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The effect of field irregularity due to the use of conducting meshes to cover holes of a lower electrode in a parallel-plate electrostatic analyzer, is experimentally and numerically investigated. Displacement of a focal point and degradation of analyzer characteristics are found in the experiment. Dependence of analyzer characteristics on wire spacing is obtained. Primary results are also confirmed by numerical analysis. Criteria for error estimation are theoretically derived and found to be consistent with the experiment.

引用

页码：1606 / 1612

页数：7

共 17 条

[1]

BERGMAN T, 1992, REV SCI INSTRUM, V60, P347

[2] FRINGING FIELD OF ELECTROSTATIC ANALYZERS [J].