A LOW-TEMPERATURE, ULTRAHIGH-VACUUM, MICROWAVE-FREQUENCY-COMPATIBLE SCANNING TUNNELING MICROSCOPE

被引：41

作者：

STRANICK, SJ ^{[1
]}

KAMNA, MM ^{[1
]}

WEISS, PS ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT CHEM,UNIVERSITY PK,PA 16802

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 10期

关键词：

D O I：

10.1063/1.1144551

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.

引用

页码：3211 / 3215

页数：5

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