X-RAY STUDIES OF KRYPTON, XENON AND LEAD INCLUSIONS IN ALUMINUM SINGLE-CRYSTALS

被引:25
作者
GRABAEK, L [1 ]
BOHR, J [1 ]
JOHNSON, E [1 ]
ANDERSEN, HH [1 ]
JOHANSEN, A [1 ]
SARHOLTKRISTENSEN, L [1 ]
机构
[1] HC ORSTED INST,DK-2100 COPENHAGEN 0,DENMARK
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1989年 / 115卷
关键词
D O I
10.1016/0921-5093(89)90663-1
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:97 / 101
页数:5
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