HIGH-SENSITIVITY MICROWAVE-INDUCED PLASMA-MASS SPECTROMETRY FOR TRACE-ELEMENT ANALYSIS

被引：80

作者：

OKAMOTO, Y

机构：

[1] Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyo University, Kawagoe

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1994年 / 9卷 / 07期

关键词：

MICROWAVE-INDUCED ATMOSPHERIC PRESSURE NITROGEN PLASMA; MICROWAVE-INDUCED PLASMA MASS SPECTROMETRY; OKAMOTO CAVITY; TRACE ELEMENT ANALYSIS;

D O I：

10.1039/ja9940900745

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

A high power (less-than-or-equal-to 1.5 kW, 2.45 GHz) atmospheric pressure nitrogen microwave-induced plasma mass spectrometer is described for trace element analysis. The plasma, which has an annular shape, was produced by an 'Okamoto cavity' operated in a surface-wave mode. The background mass spectrum was dominated by (NO+)-N-30, N-14+ and O-16+, and argon related ions such as Ar-39+, Ar-40+, (ArC+)-Ar-52, (ArO+)-Ar-56 and Ar-80(2+), were not observed. Preliminary detection limits for K-39+, Ca-40+, Cr-52+ and Fe-56+ obtained directly were less than 5 ppt, which are lower than those for argon inductively coupled plasma mass spectrometry. Analytical curves for the elements of interest were linear over five orders of magnitude of concentration.

引用

页码：745 / 749

页数：5

共 9 条

[1] ELEMENTAL ANALYSIS WITH A MICROWAVE-INDUCED PLASMA-QUADRUPOLE MASS-SPECTROMETER SYSTEM [J].