PHOTOABSORPTANCE AND ELECTRON LIFETIME MEASUREMENT IN HGCDTE

被引：10

作者：

DOYLE, OL ^{[1
]}

MROCZKOWSKI, JA ^{[1
]}

SHANLEY, JF ^{[1
]}

机构：

[1] HONEYWELL ELECTROOPT DIV,LEXINGTON,MA 02173

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1985年 / 3卷 / 01期

关键词：

D O I：

10.1116/1.573213

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：259 / 263

页数：5

共 17 条

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[3]

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[5]

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[6]

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[7] LIGHT-INDUCED MODULATION OF BROAD-BAND OPTICAL ABSORPTION IN CDS [J].

CONWAY, EJ .

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[8] LIFETIME MEASUREMENTS OF EXCESS CARRIERS IN SEMICONDUCTORS [J].

HARRICK, NJ .

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[9]

LOVECCHIO P, 1983, 1983 IEDM, P707

[10]

MAJOR RW, 1970, J PHYS CHEM SOLIDS, V39, P971

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