FIELD-EMISSION SPECTROSCOPY OF SINGLE-ATOM TIPS - REPLY

被引:17
作者
BINH, VT [1 ]
PURCELL, ST [1 ]
GARCIA, N [1 ]
机构
[1] UNIV AUTONOMA MADRID, E-28049 MADRID, SPAIN
关键词
D O I
10.1103/PhysRevLett.70.2504
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:2504 / 2504
页数:1
相关论文
共 12 条
  • [1] 3D CALCULATIONS AT ATOMIC SCALE OF THE ELECTROSTATIC POTENTIAL AND FIELD CREATED BY A TETON TIP
    ATLAN, D
    GARDET, G
    BINH, VT
    GARCIA, N
    SAENZ, JJ
    [J]. ULTRAMICROSCOPY, 1992, 42 : 154 - 162
  • [2] ACTIVATION ENERGY FOR THE SURFACE MIGRATION OF TUNGSTEN IN THE PRESENCE OF A HIGH-ELECTRIC FIELD
    BETTLER, PC
    CHARBONNIER, FM
    [J]. PHYSICAL REVIEW, 1960, 119 (01): : 85 - 93
  • [3] CHARACTERIZATION OF MICROTIPS FOR SCANNING TUNNELING MICROSCOPY
    BINH, VT
    MARIEN, J
    [J]. SURFACE SCIENCE, 1988, 202 (1-2) : L539 - L549
  • [4] FIELD-EMISSION ELECTRON-SPECTROSCOPY OF SINGLE-ATOM TIPS
    BINH, VT
    PURCELL, ST
    GARCIA, N
    DOGLIONI, J
    [J]. PHYSICAL REVIEW LETTERS, 1992, 69 (17) : 2527 - 2530
  • [5] ON THE ELECTRON AND METALLIC ION EMISSION FROM NANOTIPS FABRICATED BY FIELD-SURFACE-MELTING TECHNIQUE - EXPERIMENTS ON W AND AU TIPS
    BINH, VT
    GARCIA, N
    [J]. ULTRAMICROSCOPY, 1992, 42 : 80 - 90
  • [6] BINH VT, 1991, J PHYS I, V1, P605, DOI 10.1051/jp1:1991155
  • [7] INSITU FABRICATION AND REGENERATION OF MICROTIPS FOR SCANNING TUNNELLING MICROSCOPY
    BINH, VT
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 : 355 - 361
  • [8] BLELOCH AL, EUREM 92
  • [9] FIELD-EMISSION SPECTROSCOPY OF SINGLE-ATOM TIPS - COMMENT
    ERNST, N
    UNGER, J
    FINK, HW
    GRUNZE, M
    MULLER, HU
    VOLKL, B
    HOFMANN, M
    WOLL, C
    [J]. PHYSICAL REVIEW LETTERS, 1993, 70 (16) : 2503 - 2503
  • [10] MODINOS A, 1984, FIELD THERMIONIC SEC, pCH7