RELIABILITY-ANALYSIS OF A 2-UNIT COLD STANDBY REDUNDANT SYSTEM WITH 2 OPERATING MODES

被引：28

作者：

GUPTA, SM

JAISWAL, NK

GOEL, LR

机构：

[1] INDIAN STAT INST,NEW DELHI 110016,INDIA

[2] MEERUT UNIV,INST ADV STUDIES,DEPT STAT,MEERUT 250001,UTTAR PRADESH,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1982年 / 22卷 / 04期

关键词：

D O I：

10.1016/S0026-2714(82)80191-1

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：747 / 758

页数：12

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